A Method for Measuring the Thickness of Thin Bent Foils in Transmission Electron Microscopy
Identifieur interne : 001033 ( Main/Exploration ); précédent : 001032; suivant : 001034A Method for Measuring the Thickness of Thin Bent Foils in Transmission Electron Microscopy
Auteurs : P. Delavignette [États-Unis] ; R. W. Vook [États-Unis]Source :
- physica status solidi (b) [ 0370-1972 ] ; 1963.
Abstract
A new method for measuring the thickness of thin monocrystalline foils in the range of 1000 Å is presented. This method is based on the observation of Kossel‐Möllenstedt fringes in transmission electron microscopy. It differs from the classical Kossel‐Möllenstedt method in electron diffraction by the fact that no divergent beam is needed. However, the foil should be bent and the method is based on the measurement of this radius of curvature.
Url:
DOI: 10.1002/pssb.19630030406
Affiliations:
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